Fine structure of the atomic scattering factors near the iridium L-edges

We measured the reflectivity of an Athena silicon pore optics sample coated with 10-nm thick iridium near L-edges (L3 , L2, and L1) in a step 1.5 eV. The derived atomic scattering factor f2 was similar to shape absorption coefficient μ L3 L2 obtained by previous x-ray spectroscopy (XAS) measurements. fine structures can be represented strong sharp line referred as white (WL) two weak lines at center energies ∼17 ∼31 eV from each edge energy. branching ratio / L2) WL is >2, which reflects initial core-electron states available for (2p1/2) (2p3/2) processes, remains high energy +7 . 5 WL. structure seen L1 also has lines, were XAS L1-edge. Our measurements L3, edges demonstrated different technique provide structural information XAS. ground calibration measure may potentially simplified using estimated based on μ.